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TANAKA Palladium alloy suitable for semiconductor test equipment

Source:TANAKA Release Date:2024-11-08 144
Semiconductor / Electronic ChipSemiconductor Process EquipmentSemiconductor Packaging EquipmentSemiconductor Testing EquipmentSemiconductor Process Materials/Gases/ChemicalsMetalworkingMetal Materials
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Tanaka's TK-SK palladium alloy features a 640HV hardness, making it ideal for use in test socket applications.

 

TANAKA Kikinzoku Kogyo K.K. has launched TK-SK, a palladium alloy designed for probe pins used in the final testing stage, or post-processing, of semiconductor packages. This new product will be showcased via a panel display at SWTest Asia 2024, an exhibition scheduled for October 24–25, 2024, in Fukuoka, Japan, with samples available for shipping before the end of the year.

 

TANAKA develops industrial precious metal products as one of the core companies of TANAKA Precious Metals. The company has been manufacturing and supplying a range of precious metals for probe pins used in testing equipment in the front-end and back-end processes of semiconductor manufacturing. Its latest product, the TK-SK, features a 640HV hardness, making it ideal for use in test socket applications, particularly in the final continuity testing stage (back-end process).

 

Demand for high-hardness probe pins has increased in recent years. However, one common challenge with harder materials is that they can be more difficult to process and are prone to breaking during machining. Additionally, palladium alloys on the market previously had a maximum hardness of around 560HV. Through its unique processing technology, TANAKA Kikinzoku Kogyo has successfully developed TK-SK with a hardness of 640HV. By 2028, the company aims to ship 1.5 times the volume of its existing products.

 

Pogo pin-type probe pins are typically used in test sockets. During testing, the tip or plunger of the probe pin can become deformed due to friction from contact with substrates. Solder may also adhere to the plungers, needing regular cleaning, which further increases the risk of deformation due to friction. High-hardness probe pins, like TK-SK, reduce wear-related deformation, leading to longer service life and lower maintenance costs for semiconductor test equipment.

 

TANAKA plans to continue contributing to the development of the semiconductor market, which is expected to experience significant growth in the coming years.

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